A Model for Measuring Geographic Information Systems Success

A Model for Measuring Geographic Information Systems Success

Geographic Information Systems (GIS) have become a fact of our life as they are being used by more people and organizations for more complex decision problems than ever before. The use of GIS can achieve valuable benefits for individuals, organizations and society; however, the achievement of these benefits depends on the success of GIS. While information systems (IS) success models have receiv...

Measuring Enterprise Systems Success: A Preliminary Model

The business value of Enterprise Systems (ES), and in general large software implementations, has been extensively debated in both the popular press and in the academic literature for over three decades. Organizations have invested heavily in Enterprise Systems (and related infrastructure), presumably expecting positive outcomes to the organization. Some studies have reported large productivity...

Measuring Enterprise Architecture success: a tentative model for measuring success

Interest towards Enterprise Architecture (EA) has been increasing during the last few years. EA has been found to be a crucial aspect of business survival, and thus the importance of EA implementation success is also crucial. Current literature does not have a tool to be used to measure the success of EA implementation. In this paper, a tentative model for measuring success is presented and emp...

Measuring Success in Interorganizational Information Systems: A Case Study

Measuring Project Management Information Systems Success: Towards a Conceptual Model and Survey Instrument

Project management information systems (PMIS) are an important building block of efficient and effective project management. They have changed considerably in the last decades, starting as mere scheduling applications and now serving as complex systems covering a wide range of project processes and addressing a multitude of stakeholders. Vendors of PMIS frequently claim that these systems yield...